Session I: Low-Power Design and EDA
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Minimum Energy Operation of Voltage-Scaled Circuits
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Hidetoshi Onodera, Kyoto University
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*
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Greedy Dynamic Power (GDP): Power Budgeting and Thermal Management of Multi-Core Systems in the Dark Silicon Era
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Hai Wang, University of Electronic Science and Technology of China
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Power Oriented CMOL Defect-Tolerant Mapping with Available Nanodevices
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Shangluan Xie, Ningbo University
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Session II: Reliability-Aware IC Design
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Reliable Design for 3D ICs: From Microarchitecture and Physical Design Perspectives
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Yuanqing Cheng, Beihang University
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Analysis of ESD Effect and Ionizing Radiation Particles in Gate Oxide
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C.-Z. Chen, EtownIP Microelectronics
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PCM Waer Leveling AMT Product Team
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Chengyu Xu, Chien Wang, Jiangsu Advanced Memory Technology Co. Ltd.
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Session III: DTCO Joint session ( II & IX)
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Monolithic 3D enabled Processing-in- SRAM Memory
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Vijaykrishnan Narayanan, Pennsylvania State University
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Reduction of Systematic Defects Through Machine Learning from Design to Fab
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James Word, Mentor Graphics
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Full Chip Curvilinear ILT in a Day
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Leo Pang, D2S
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Session IV: EDA + AI
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Optical Networks-on-Chip (ONoCs): EDA Achievements
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Ulf Schlicthmann, Technical University of Munich
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Learning-Based Power Modeling and Optimization for FPGA
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Wei Zhang, Hong Kong University of Science and Technology
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An Artificial Intelligence Based Defects Auto-Classification System in Semiconductor Manufacturing
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Pengfei Wang, Shanghai IC R&D Center
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A Neural-Network Approach to Better Diagnosis of Defect Pattern in Wafer Bin Map
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Junjun Zhuang, HLMC
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Perceptron Algorithm and Its Verilog Design
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Wang Kainan, Institute of Information Engineering, CAS
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Session V: Advanced IC Design
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A Clock Jitter Tolerant Σ∆ Modulator Employing A Hybrid Loop Filter in CMOS 40nm Technology
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Jose Silva-Martinez, Texas A&M University
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Energy-Efficient Inverter-Based Amplifiers: From fundamentals to the state-of-the-arts
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Youngcheol Chae, Yonsei University
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Towards Optimal Logic Representations for Implication-based Memristive Circuits
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Lin Chen, Ningbo University
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Timing Violation as Dominant Reason For Failure of Clocked Digital Circuit due to RF Interference in Supply
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Shanshan Nong, School of Electronics and Information Technology, Sun Yat-sen University
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Session VI: From Physical to System Design
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A Classification Framework Using Incorrectly Labeled Data for Manufacturing Applications
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Xin Li, Duke University
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*
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DREAMPlace 2.0: an Open-Source GPU-Accelerated Global and Detailed Placement for Large-Scale VLSI Designs
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Yibo Lin, Peking University
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A Novel Cellular Array Design Using Quantum-dot Cellular Automata
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Huiming Tian, Ningbo University
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Scalable Multi-Session TCP Offload Engine for Latency-Sensitive Applications
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Jingbo Gao, Fudan University
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