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Jinling Yang received the Ph.D. degree in solid state physics from Institute of Physics, CAS in 1997. After a two-year stay at Venture Business Laboratory of Tohoku University as a Post-doc., she joined IMTEK, University of Freiburg, as a Post-doc. and worked on the reliability of MEMS thin films. In 2002, she joined in Institute of Physics, University of Basel and IBM Zurich Research Lab, Switzerland, to work on scanning force microscopy with ultrasmall cantilevers. Since 2004, she has worked as a Professor in Institute of Semiconductors, CAS. Her group focuses on resonator-based MEMS devices, reliability of MEMS thin films and MEMS devices.
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