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Doctor Roy Pinhassi is a seasoned semiconductor metrology professional, who has led the transition from LAB-to-FAB of innovative metrology technologies for process control and advanced material characterization.
In his current position, Dr. Pinhassi is the Nova ElipsonTM Product Marketing Manager, leading the global penetration and adoption activities of Nova’s High-Volume Manufacturing (HVM) Raman Spectroscopy platform. The Nova Elipson has been adopted by industry leaders as the technology of choice for critical process steps of advanced technology nodes.
Before joining Nova, Dr. Pinhassi held various technological roles with Applied Materials Inc., first at the Scanning Electron Microscopy (SEM) division, where he had worked on cold-field emission electron sources and on elemental mapping by Energy-dispersive X-ray spectroscopy (EDS), and later with the Applied CTO office, where he held a business development role working to extend the company’s Atomic Layer Deposition (ALD) offering to new markets.
One of the outcomes of this activity has led to a fruitful collaboration with a venture capital partner, and to the transformation of this groundbreaking technology into a spin-off in the pharma domain. This technology has matured and has recently entered clinical trials.
Dr. Pinhassi holds a Ph.D. from the Israel Technion Nanotechnology Program, where he was specializing in Electrochemistry for Renewable Energy Production and authored numerous papers in the field.
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