Origin: China
Education:
B.S. in Software Engineering, Shanghai University of Electric Power, China
M.S. in Media and Governance, Keio University Graduate School, Japan
Professional Career:
2019-2023: KIOXIA Corporation (Toshiba Memory)
Developed algorithms for wafer defect identification by deep learning.
2023-Present: Hitachi High-Tech Corporation
Focused on research in deep learning-based image processing techniques.
