Symposium I: Device Engineering and Memory Technology

Symposium Committee

Prof. Ru Huang
Chair
Southeast University , China
   
Prof. Cor Claeys
Co-Chair
KU Leuven, Belgium
   
Dr. Minhwa Chi
Co-Chair
SiEn (Qingdao) Integrated Circuits Co., China
   
Prof. Qianqian Huang
Co-Chair
Peking University, China
   
Prof.Gong Xiao
Member
National University of Singapore
   
Prof. Ming He
Member
Peking University, China
   
Dr. Zongliang Huo
Member
Yangtze Memory Technology Co., Ltd
   
Prof. Mario Lanza
Member
National University of Singapore
   
Prof. Han Li
Member
Southeast Univeristy, China
   
Prof. Jun-wei Luo
Member
Institute of Semiconductors, CAS
   
Dr. Wensheng Qian
Member
HHGrace, China
   
Dr. Huiling Shang
Member
TSMC
   
Prof. Xinran Wang
Member
Nanjing University, China
   
Dr. Zhiqiang Wei
Member
Avalanche Technology
   
Prof. Huaqiang Wu
Member
Tsinghua University
   
Prof. Yuchao Yang
Member
Peking University, China
   
Dr. Frank Bin Yang
Member
Qualcomm, USA
   
Prof. Bin Yu
Member
Zhejiang Univeristy, China
   
Dr. Lijie Zhang
Member
Semiconductor Technology Innovation Center (Beijing) Corp.
   
Prof. Peng Zhou
Member
Fudan Univeristy, China
   

Symposium I: Device Engineering and Memory Technology

  •  Advanced MOS devices
  •  Memory devices (DRAM, SRAM, Flash, emerging memory devices)
  •  Device reliability
  •  Mobility enhancement technology
  •  Shallow junction formation
  •  Source/drain engineering (silicide/salicide)
  •  RF/HV/Power devices
  •  Other emerging devices